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| 74F1056 8-Bit Schottky Barrier Diode Array December 1993 Revised August 1999 74F1056 8-Bit Schottky Barrier Diode Array General Description The 74F1056 is an 8-bit Schottky barrier diode array designed to be employed as termination on the inputs to memory bus lines or CLOCK lines. This device is designed to suppress negative transients caused by line reflections, switching noise and crosstalk. Features s 8-Bit array structure designed to suppress negative transients s Guaranteed ESD protection (HBM) in excess of 4 kV s Common anode shared by all eight diodes s Broadside pinout for ease of bus routing Ordering Code: Order Number 74F1056SC Package Number M16A Package Description 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow Devices also available in Tape and Reel. Specify by appending the suffix letter "X" to the ordering code. Connection Diagram Schematic Diagram (c) 1999 Fairchild Semiconductor Corporation DS011655 www.fairchildsemi.com 74F1056 Absolute Maximum Ratings(Note 1) Storage Temperature Operating Free-Air Temperature Steady State Reverse Voltage, (VR) Continuous Total Power Dissipation at or below 25C Free-Air Temperature, (PD) Continuous Forward Current, (If) Any Output Pin to GND Total Through All GND Pins Repetitive Peak Forward Current, lfp (Note 2) Any Output Pin to GND Total Through All GND Pins ESD (HBM) 300 mA 1.2A 4 kV 50 mA 170 mA Note 1: Absolute maximum ratings are valued beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: These values apply for the tw 100 s, duty cycle 20%. -65C to +150C 0C to 70C 7.0V 750 mW DC Electrical Characteristics Over recommended operating free air temperature range, unless otherwise noted SINGLE DIODE OPERATION (Note 3) Symbol VBR IR VF CT Parameter Reverse Breakdown Voltage Static Reverse Current Static Forward Voltage Total Capacitance -0.65 -0.8 5 4 Note 3: These tests apply to separate diode operation, diodes not under test are open-circuit. Min 7.0 Typ Max Units V IR = 10 A VR = 7V IF = -16 mA IF = -50 mA pF A V Conditions 10 -0.85 -1.0 10 8 VI = 0V, f = 1 MHz VI = 2V, f = 1 MHz MULTIPLE DIODE OPERATION Symbol ICR Parameter Internal Crosstalk Current Min Typ 0.2 Max 2 Units mA Conditions Total GND current = 1.2A (Note 4) Note 4: ICR is measured under the following conditions: Switching diodes: tW = 100 s; Static diode: VIN = 6V Duty cycle = 20%, If = 200 mA One diode static, all others switching The static diode input current is the internal crosstalk current ICR. AC Electrical Characteristics TA = 25C Symbol VFR TRR Parameter Forward Recovery Voltage Reverse Recovery Time Min Typ 1.25 5.0 Max Units V ns Conditions IF = 300 mA IF = 10 mA, IR = 1 mA RL = 100 Figure Number Figure 1 Figure 2 www.fairchildsemi.com 2 74F1056 AC Loading and Waveforms tr = 20 ns, ZO = 50, freq = 500 Hz FIGURE 1. Forward Recovery Voltage tf = 0.5 ns, ZO = 50, tW = 50 ns, duty cycle = 0.01 RL = 100 (Note ) Monitored by Oscilloscope having the following characteristics: tr 350 ps, RI = 50, CI = 5 pF. FIGURE 2. Reverse Recovery Time 3 www.fairchildsemi.com 74F1056 8-Bit Schottky Barrier Diode Array Physical Dimensions inches (millimeters) unless otherwise noted 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow Package Number M16A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 4 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com |
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